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Metrology Lab

The purpose of this laboratory is; to familiarize students with laboratory measuring devices, to study the measurements methods, to learn proper measuring techniques through simple measurements of mass, length, and time, and to learn to express the results of calculations so as to correctly reflect the effects of measurement uncertainty. Examples of the machines, equipment, and instruments included in the IED Metrology Lab include:

  1. Scanning electron Microscope (SEM, Jeol Japan)
  2. 3D surface profilometer (Contour-GTK, Bruker, USA)
  3. Stylus based profile and roughness scanner (Form Talysurf from Taylor Hobson)
  4. Portable roughness testers
  5. Optical microscopes
  6. Optical comparators
  7.  Auto collimator
  8. Height measurement LVDTs
  9. Vernier calipers
  10. Screw gauges
  11. Slip gauges

 

Following are real photos of some machines and equipment in the Metrology lab.

 

 

 

 

For more information about the IED laboratories, please download the following IE bulletin: