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Metrology Laboratory

Metrology Lab

The purpose of this laboratory is; to familiarize students with laboratory measuring devices, to study the measurements methods, to learn proper measuring techniques through simple measurements of mass, length, and time, and to learn to express the results of calculations so as to correctly reflect the effects of measurement uncertainty. Examples of the machines, equipment, and instruments included in the IED Metrology Lab include:

  1. Scanning electron Microscope (SEM, Jeol Japan)
  2. 3D surface profilometer (Contour-GTK, Bruker, USA)
  3. Stylus based profile and roughness scanner (Form Talysurf from Taylor Hobson)
  4. Portable roughness testers
  5. Optical microscopes
  6. Optical comparators
  7.  Auto collimator
  8. Height measurement LVDTs
  9. Vernier calipers
  10. Screw gauges
  11. Slip gauges

 

Following are real photos of some machines and equipment in the Metrology lab.

 

Scanning Electron Microscope (SEM)
with backscattered imaging capability

A tabletop scanning electron microscope (SEM)

(Model JCM 6000Plus) from Jeol, Tokyo, Japan

can be used to examine the surface

morphologies and materials phase analysis.

 

 

3D Profile

A 3D optical profilometer (Contour GT-K)

from Bruker (Berlin, Germany)

is used to measure the roughness

and 3D surface characteristics.

Profile Projector

This machine is used to measure and inspect

all kinds of surface and outline of complicated

work-pieces, such as cam, screw thread, gear,

milling cutter, tools, dies, press components and so on.

Form Talysurf

Form Talysurf 50i Series 2 (S3C)

for measuring form and surface finish.

Tool maker’s microscope

This is device used to measure up to 1/100th of a mm.

these microscope suitable for such functions as

the inspection and measurement of various miniature

mechanical and electronic parts.

Autocollimators

This is device used for measuring angles,

straightness, flatness, squareness and parallelism.

 

 

 

For more information about the IED laboratories, please download the following IE bulletin: